Researchers at the Center for Crop and Disease Management (CCDM) have developed a new system that combines spore trapping ...
Penn Engineers have developed an open-source algorithm that combines the speed of AI with the precision of geometry to ...
Abstract: Spatial defect patterns on semiconductor wafer bin maps can provide valuable information on the root causes of process abnormalities. Thus, the identification of these patterns is important ...
Abstract: Anomaly detection significantly enhances the robustness of cloud systems. While neural network-based methods have recently demonstrated strong advantages, they encounter practical challenges ...