Scan testing has been the foundation of digital-device production test for many years. Several innovations have been developed to keep up with the growth in pattern-set sizes brought about by large ...

[Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based development board to output different test patterns in PAL/NTSC. If one is checking ...

This paper is presented with the Video Graphics Array (VGA) and Digital Visual Interface - Digital (DVI-D) test pattern generator solution with display monitor timing specification as per the Video ...

Test compression sounds like magic. Read on to learn how this trick is done. Large, complex ICs are viable because their design meets test as well as functional requirements. Design for test (DFT) was ...