Researchers and industries have been using transmission electron microscopy (TEM) to study semiconductors' stacking and dislocation faults. This article considers the analysis of crystal structures.
An international team of researchers, led by University of Toronto Engineering Professor Yu Zou, is using electric fields to control the motion of material defects. This work has important ...
Defect bits: representation of two n-bits along a defect line (shown in black). Shown are the orientations of the rod-like molecules that comprise liquid crystals. (Courtesy: Žiga Kos and Jörn ...
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