Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser ...
Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...
In this interview, Professor Emeritus Mervyn Miles at the University of Bristol speaks about the history and technology behind Atomic Force Microscopy (AFM) and Scanning Probe Microscopy (SPM). Can ...
Researchers have successfully developed a new time-resolved atomic force microscopy (AFM) technique, integrating AFM with a unique laser technology. This method enables the measurement of ultrafast ...
Christoph Gerber, who co-invented the atomic force microscope, tells Matthew Chalmers how the AFM came about 30 years ago and why it continues to shape research at the nanoscale Nano-vision Christoph ...
Overview of the main types of Scannig Probe Microscope types: Scanning tunneling microscope (STM) – using the tunneling current I between the outermost atom of a conducting probe within an atomic ...
AFM differs significantly from traditional microscopy techniques as it does not project light or electrons on the sample's surface to create its image. Instead, AFM utilizes a sharp probe while ...
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